A. G. Cullis

Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 (eBook, PDF)

• Format: PDF

Produktbeschreibung

Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques.

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 820
• Erscheinungstermin: 31. Januar 2021
• Englisch
• ISBN-13: 9781000112207
• Artikelnr.: 60723265

Autorenporträt

A. G. Cullis (Author) , P. D. Augustus (Volume editor)

Inhaltsangabe

High resolution microscopy (9 papers). Epitaxial layers (21 papers).
Quantum wells and superlattices (11 papers). Properties of dislocations (5
papers). Device silicon and dielectric structures (24 papers). Silicides
and contacts (5 papers). Device testing (6 papers). X-ray techniques (5
papers). Microanalysis (6 papers). Advanced scanning microscopy techniques
(17 papers). Bulk gallium arsenide and other compounds (15 papers). Author
index. Subject index.