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  • Format: ePub

For centuries, a universal measurement of length has been sought and redefined, with different variations being established. The current metric system uses the International System of Units (SI) definition in which metre is the official measurement. Optical interferometry is a method of measurement based on the position of light waves that can be used to measure the length of material measures and distances. Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the fields of length and distance…mehr

Produktbeschreibung
For centuries, a universal measurement of length has been sought and redefined, with different variations being established. The current metric system uses the International System of Units (SI) definition in which metre is the official measurement. Optical interferometry is a method of measurement based on the position of light waves that can be used to measure the length of material measures and distances. Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the fields of length and distance metrology.

Written by leading experts in the field of length metrology, this comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. It also explores fundamental principles of the most important interferometric procedures for length measurements by interferometry. All of which are based on the wave properties of light. Advanced solutions that can be used for various applications have been developed and discussed. For those interested in measuring the length at the highest possible level, this book will provide essential information and applications, and it provides a detailed profile of interferometry that can be used by students, practitioners and researchers, as well as those with an interest in high-level length metrology.


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