Written by leading experts in the field of length metrology, this comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. It also explores fundamental principles of the most important interferometric procedures for length measurements by interferometry. All of which are based on the wave properties of light. Advanced solutions that can be used for various applications have been developed and discussed. For those interested in measuring the length at the highest possible level, this book will provide essential information and applications, and it provides a detailed profile of interferometry that can be used by students, practitioners and researchers, as well as those with an interest in high-level length metrology.
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