Optical Techniques for Solid-State Materials Characterization (eBook, PDF)

Redaktion: Prasankumar, Rohit P.; Taylor, Antoinette J.

• Format: PDF

Produktbeschreibung

With chapters written by pioneering experts in various optical techniques, this comprehensive reference provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. It explains how to use the techniques to acquire, analyze, and interpret data for gaining insight into material properties. The book describes the tools needed to implement a particular optical experiment and includes examples that help readers interpret and understand the resulting data. It also presents useful information on common light sources, optical components, detectors, spectrometers, and cryostats.

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Produktdetails

• Verlag: Taylor & Francis eBooks
• Seitenzahl: 748
• Erscheinungstermin: 19. April 2016
• Englisch
• ISBN-13: 9781439814376
• Artikelnr.: 38301556

Inhaltsangabe

BACKGROUND: Light-Matter Interactions. Semiconductors and Their Nanostructures. The Optical Properties of Metals: From Wideband to Narrowband Materials. LINEAR OPTICAL SPECTROSCOPY: Methods for Obtaining the Optical Constants of a Material. Methods for Obtaining the Optical Response after CW Excitation. Raman Scattering as a Tool for Studying Complex Materials. TIME-RESOLVED OPTICAL SPECTROSCOPY: Ultrashort Pulse Generation and Measurement. Carrier Dynamics in Bulk Semiconductors and Metals after Ultrashort Pulse Excitation. Ultrafast Pump-Probe Spectroscopy. Transient Four-Wave Mixing. Time-Domain and Ultrafast Terahertz Spectroscopy. Time-Resolved Photoluminescence Spectroscopy. Time-Resolved Magneto-Optical Spectroscopy. Time-Resolved Raman Scattering. SPATIALLY RESOLVED OPTICAL SPECTROSCOPY: Microscopy. Micro-Optical Techniques. Near-Field Scanning Optical Microscopy. RECENT DEVELOPMENTS: Recent Developments in Spatially and Temporally Resolved Optical Characterization of Solid-State Materials. Index.

Rezensionen

This book has comprehensively covered the essential optical approaches needed for solid-state materials characterization. Written by experts in the field, this will be a great reference for students, engineers, and scientists.
-Professor Yoke Khin Yap, Michigan Technical University