J. W. McPherson

Reliability Physics and Engineering (eBook, PDF)

Time-To-Failure Modeling

• Format: PDF

Produktbeschreibung

Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: .Materials/Device Degradation .Degradation Kinetics .Time-To-Failure Modeling .Statistical Tools .Failure-Rate Modeling .Accelerated Testing .Ramp-To-Failure Testing .Important Failure Mechanisms for Integrated Circuits .Important Failure Mechanisms for Mechanical Components .Conversion of Dynamical Stresses into Static Equivalents .Small Design Changes Producing Major Reliability Improvements This textbook includes numerous example problems with solutions. Also, exercise problems along with answers are included at the end of each chapter. Reliability Physics and Engineering can be a useful resource for students, engineers and materials scientists.

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Produktdetails

• Verlag: Springer US
• Seitenzahl: 318
• Erscheinungstermin: 5. August 2010
• Englisch
• ISBN-13: 9781441963482
• Artikelnr.: 43800905

Autorenporträt

Dr. J.W. McPherson is a Texas Instruments Senior Fellow Emeritus and an IEEE Fellow. He has published approximately 200 papers on Reliability Physics and Engineering, written Reliability Chapters in four books, holds 12 patents and was a past General Chair of the International Reliability Physics Symposium. McPherson's broad reliability experience, with both electrical and mechanical failure mechanisms, makes him ideally suited to author a general textbook on Reliability Physics and Engineering.

Inhaltsangabe

Introduction.- Physics of Degradation.- Time Dependence of Materials and Device Degradation.- From Material/Device Degradation to Time-To-Failure.- Time-To-Failure Modeling.- Gaussian Statistics - An Overview.- Time-To-Failure Statistics.- Failure Rate Modeling.- Accelerated Degradation.- Acceleration Factor Modeling.- Ramp-To-Failure Testing.- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits.- Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering.- Conversion of Dynamical Stresses Into Effective Static Values.- Resonance and Resonance-Induced Degradation.- Increasing the Reliability of Device/Product Designs.- Screening.- Heat Generation and Dissipation.- Sampling Plans and Confidence Intervals.-

Rezensionen

"Reliability Physics and Engineering: Time-to-Failure Modeling ... presents good technical insights into advance reliability physics theories and modeling, suitable for both industry and academic practitioners. The authors provide insights into the broad values and technical applications of reliability and safety engineering in this book. ... Valuable as a learning tool reliability physics and modeling, its clear relevance to real-world industry practices make it useful for both academics and semiconductor industry practitioners." (Chong Leong Gan, Life Cycle Reliability and Safety Engineering, Vol. 9, 2020)