Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

Sample Preparation Handbook for Transmission Electron Microscopy (eBook, PDF)

Methodology

• Format: PDF

Produktbeschreibung

This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology.

Key Features of the Handbook:

• Combines all of the latest techniques for the preparation of mineral to biological samples



• Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)



• Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis



• Links to a complementary interactive database website which is available to scientists worldwide*



• Written by authors with 100 years of combined experience in electron microscopy

http://temsamprep.in2p3.fr/

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Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Produktdetails

• Verlag: Springer US
• Seitenzahl: 250
• Erscheinungstermin: 3. Juli 2010
• Englisch
• ISBN-13: 9780387981826
• Artikelnr.: 37289508

Inhaltsangabe

Methodology: General Introduction.- to Materials.- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM).- Materials Problems and Approaches for TEM and TEM/STEM Analyses.- Physical and Chemical Mechanisms of Preparation Techniques.- Artifacts in Transmission Electron Microscopy.- Selection of Preparation Techniques Based on Material Problems and TEM Analyses.- Comparisons of Techniques.- Conclusion: What Is a Good Sample?.

Rezensionen

From the reviews:
"This textbook is the combined result ... of four French microscopists and one Swiss microscopist who use similar TEM techniques for the study of quite different specimens; this explains the very wide scope in terms of techniques covered which distinguishes this book from related previous ones. ... this recommendable book is useful for researchers and technicians working in TEM preparation laboratories. ... a truly indispensable manual that is guaranteed to make it onto the shelf of almost every laboratory concerned with TEM sample preparation." (Thomas Walther, Infocus Magazine, Issue 23, September, 2011)