Semiconductor Devices in Harsh Conditions (eBook, ePUB)

Redaktion: Weide-Zaage, Kirsten; Chrzanowska-Jeske, Malgorzata

• Format: ePub

Produktbeschreibung

The book focuses on radiation, operating conditions, sensor systems, and package and system design.

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Produktdetails

• Verlag: Taylor & Francis eBooks
• Seitenzahl: 256
• Erscheinungstermin: 25. November 2016
• Englisch
• ISBN-13: 9781315351940
• Artikelnr.: 47381540

Inhaltsangabe

Section I Radiation. Commercial Off-the-Shelf Components in Space
Applications. Soft Errors in Digital Circuits Subjected to Natural
Radiation: Characterisation, Modelling and Simulation Issues. Simulation of
Single-Event Effects on Fully Depleted Siliconon-Insulator (FDSOI) CMOS.
Section II Sensors and Operating Conditions. Electronic Sensors for the
Detection of Ovarian Cancer. Sensors and Sensor Systems for Harsh
Environment Applications. III-Nitride Electronic Devices for Harsh
Environments. Section III Packaging and System Design. Packaging for
Systems in Harsh Environments. Corrosion Resistance of Lead-Free Solders
under Environmental Stress. From Deep Submicron Degradation Effects to
Harsh Operating Environments: A Self-Healing Calibration Methodology for
Performance and Reliability Enhancement. Role of Diffusional Interfacial
Sliding during Temperature Cycling and Electromigration-Induced Motion of
Copper Through Silicon Via.