Drawing upon years of practical experience and using numerous examples and illustrative applications, Andrew Perkins and Suresh Sitaraman cover state of the art technologies in solder joint reliability, including:
A comprehensive summary of current literature on lead-containing ceramic area array electronic package solder joining reliability,
Useful and easy-to-use tools for predicting solder joint fatigue life under thermal cycling, and power cycling enviroments,
New insight into solder joint reliability testing under multiple environments, including vibration environments,
A methodology for predicting solder joint reliability using numerical simulations and experimental data under multiple environments that can be related to any package type.
Solder Joint Reliability Prediction for Multiple Environments is a must have book for practitioners and researchers who specialize in solder.
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