Shigemi Terakawa

Structure and Electronic Properties of Ultrathin In Films on Si(111) (eBook, PDF)

• Format: PDF

Produktbeschreibung

This book reports the establishment of a single-atomic layer metal of In and a novel (In, Mg) ultrathin film on Si(111) surfaces. A double-layer phase of In called "rect" has been extensively investigated as a two-dimensional metal. Another crystalline phase called "hex" was also suggested, but it had not been established due to difficulty in preparing the sample. The author succeeded in growing the large and high-quality sample of the hex phase and revealed that it is a single-layer metal. The author also established a new triple-atomic layer (In, Mg) film with a nearly freestanding character by Mg deposition onto the In double layer. This work proposes a novel method to decouple ultrathin metal films from Si dangling bonds.

The present study demonstrates interesting properties of indium itself, which is a p-block metal both with metallicity and covalency. In this book, readers also see principles of various surface analysis techniques and learn how to use them and analyze the results in the real systems. This book is useful to researchers and students interested in surface science, particularly ultrathin metal films on semiconductor surfaces.

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Produktdetails

• Verlag: Springer Nature Singapore
• Seitenzahl: 76
• Erscheinungstermin: 7. November 2022
• Englisch
• ISBN-13: 9789811968723
• Artikelnr.: 66376072

Autorenporträt

Dr. Shigemi Terakawa's research fields are surface science and 2D materials. He has investigated the structure and electronic properties of atomically thin metal films on semiconductor surfaces using surface science techniques (ARPES, LEED and STM) and DFT calculation. He is now particularly interested in novel electronic properties observed in heterostructures of 2D materials with magnetic order.

Inhaltsangabe

1. Introduction.- 2. Experimental methods.- 3. Structure and electronic properties of In single-layer metal on Si(111).- 4. Structure and electronic properties of ultrathin (In, Mg) films on Si(111).- 5. Summary.