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Inorganic materials show a diverse range of important properties that are desirable for many contemporary, real-world applications. Good examples include recyclable battery cathode materials for energy storage and transport, porous solids for capture and storage of gases and molecular complexes for use in electronic devices. An understanding of the function of these materials is necessary in order to optimise their behaviour for real applications, hence the importance of 'structure-property relationships'. The chapters presented in this volume deal with recent advances in the characterisation…mehr

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Produktbeschreibung
Inorganic materials show a diverse range of important properties that are desirable for many contemporary, real-world applications. Good examples include recyclable battery cathode materials for energy storage and transport, porous solids for capture and storage of gases and molecular complexes for use in electronic devices. An understanding of the function of these materials is necessary in order to optimise their behaviour for real applications, hence the importance of 'structure-property relationships'. The chapters presented in this volume deal with recent advances in the characterisation of crystalline materials. They include some familiar diffraction methods, thoroughly updated with modern advances. Also included are techniques that can now probe details of the three-dimensional arrangements of atoms in nanocrystalline solids, allowing aspects of disorder to be studied. Small-angle scattering, a technique that is often overlooked, can probe both ordered and disordered structures of materials at longer length scales than those probed by powder diffraction methods. Addressing both physical principals and recent advances in their applications, Structure from Diffraction Methods covers: * Powder Diffraction * X-Ray and Neutron Single-Crystal Diffraction * PDF Analysis of Nanoparticles * Electron Crystallography * Small-Angle Scattering Ideal as a complementary reference work to other volumes in the series (Local Structural Characterisation and Multi Length-Scale Characterisation), or as an examination of the specific characterisation techniques in their own right, Structure from Diffraction Methods is a valuable addition to the Inorganic Materials Series.

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Autorenporträt
I have truly come a long way without rest. Born into a humble background, I now appreciate the taste of gradually achieving success in life. If everything had been accomplished from the beginning, what fun would life have held? The author of this book, Lawyer Bruce Yoon, worked as a Foreign Affairs Detective in Korea for five years before studying abroad in Australia, where he began studying computer science. He then explored software development and consulting while searching for his purpose. During that time, he pursued theological studies and later participated in M&A projects. Following his involvement in IT/BT businesses, he enrolled in law school and became an attorney.