K. C. Khulbe, C. Y. Feng, Takeshi Matsuura

Synthetic Polymeric Membranes (eBook, PDF)

Characterization by Atomic Force Microscopy

• Format: PDF

Produktbeschreibung

Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.

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Produktdetails

• Verlag: Springer Berlin Heidelberg
• Seitenzahl: 198
• Erscheinungstermin: 3. Dezember 2007
• Englisch
• ISBN-13: 9783540739944
• Artikelnr.: 37368416

Inhaltsangabe

Synthetic Membranes for Membrane Processes.- Atomic Force Microscopy.- Nodular Structure of Polymers in the Membrane.- Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface.- Cross-sectional AFM Image.- Adhesion.- Membrane Surface Morphology and Membrane Performance.

Rezensionen

From the reviews: "This latest addition to the Springer Laboratory series provides a good overview of membrane technology and the application of atomic force microscopy (AFM) in membrane characterization. It is easy to read ... . In summary, this book presents a good introduction to the field of membrane science and technology. It will be of interest to both academics and industrialists involved in the use of membranes in separation processes and will be particularly welcomed by experimentalists who wish to become involved in AFM." (Peter A. Williams, Materials Today, Vol. 11 (5), May, 2008)