Kenneth P. Parker

The Boundary-Scan Handbook (eBook, PDF)

• Format: PDF

Produktbeschreibung

Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book.

Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;

Explains the new IEEE 1149.8.1 subsidiary standard and applications;

Describes the latest updates on the supplementary IEEE testing standards.

In particular, addresses:

IEEE Std 1149.1 Digital Boundary-Scan

IEEE Std 1149.4 Analog Boundary-Scan

IEEE Std 1149.6 Advanced I/O Testing

IEEE Std 1149.8.1 Passive Component Testing

IEEE Std 1149.1-2013 The

2013 Revision of 1149.1

IEEE Std 1532 In-System Configuration

IEEE Std 1149.6-2015 The 2015 Revision of 1149.6

---

Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Produktdetails

• Verlag: Springer Nature Switzerland
• Seitenzahl: 552
• Erscheinungstermin: 11. November 2015
• Englisch
• ISBN-13: 9783319011745
• Artikelnr.: 44120017

Autorenporträt

Dr. Kenneth P. Parker received his PHD at Stanford University. He has recently retired from a career with Hewlett-Packard and Agilent Technologies in the field of testing of electrical assemblies.

Inhaltsangabe

Boundary-Scan Basics And Vocabulary.- Boundary-Scan Description Language (BSDL).- Boundary-Scan Testing.- Advanced Boundary-Scan Topics.- Design for Boundary-Scan Test.- Analog Measurement Basics.- IEEE 1149.4 Analog Boundary-Scan.- IEEE 1149.6 Testing Advanced I/O.- IEEE 1532:In-System Configuration.- IEEE 1149.8.1: Passive Components.- IEEE 1149.1:The 2013 Revision.- IEEE 1149.6: The 2015 Revision.

Rezensionen

"This is a well-written book that will take some of the mystery out of boundary scan. Those getting involved with boundary scan will find it both useful and interesting." D. Romanchik in Test & Measurement World, November 1992 'I greatly enjoyed reading this book. In it, Ken Parker presents a highly practical view of IEEE std. 1149.1 and the ways in which boundary scan can be used to achieve real business benefits. The book provides an excellent introduction to boundary scan technology for the novice, to whom I strongly recommend it. It also provides an entertaining and refreshing view of boundary-scan for those with more experience.' IEEE Design & test of Computers 10:1 1993 '... this book will become essential reading over the next few years by anybody who needs to understand the basics of boundary scan and its practical implementation in industry.' Microprocessors and Microsystems 17:5 1993

"This is a well-written book that will take some of the mystery out of boundary scan. Those getting involved with boundary scan will find it both useful and interesting." D. Romanchik in Test & Measurement World, November 1992
'I greatly enjoyed reading this book. In it, Ken Parker presents a highly practical view of IEEE std. 1149.1 and the ways in which boundary scan can be used to achieve real business benefits. The book provides an excellent introduction to boundary scan technology for the novice, to whom I strongly recommend it. It also provides an entertaining and refreshing view of boundary-scan for those with more experience.' IEEE Design & test of Computers 10:1 1993
'... this book will become essential reading over the next few years by anybody who needs to understand the basics of boundary scan and its practical implementation in industry.' Microprocessors and Microsystems 17:5 1993