P. B. Kenway, P. J. Duke

X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK (eBook, PDF)

• Format: PDF

Produktbeschreibung

The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemist

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 680
• Erscheinungstermin: 7. Oktober 2020
• Englisch
• ISBN-13: 9781000112276
• Artikelnr.: 60317805

Autorenporträt

P.B. Kenway and P. J. Duke

Inhaltsangabe

Cosslett symposium: (speakers T Mulvey, W C Nixon, R W Horne, A Glauert, J
V Long, P Duncumb, A Boyde, P W Hawkes). Invited papers: Recent advances in
electron microprobe analysis (S J B Reed); Database and review of
quantitative EMPA procedures (K F J Heinrich); Atomic resolution incoherent
imaging and analysis with the STEM (S J Pennycook et al); The quantitative
analysis of thin specimens (D B Williams); Imaging surfaces with scanning
tunnelling and scanning force microscopes (H-J Butt); Aspects of 3-D
imaging, display and measurement in light and scanning electron microscopy
(A Boyde); Developments in image processing (P W Hawkes). Never mind the
baby, how about the bath water?: insights from the secondary electron
background in electron spectroscopy (J A D Matthew et al); The use of
integrated circuits for position-sensitive detection (J Comer et al);
Surface studies in UHV-SEM and STEM (J A Venables et al); Electron
spectroscopy at high spatial resolution (P Kruit); The performance of the
photoelectron spectromicroscope at low and high energies (D W Turner and I
R Plummer); Laser-plasma XUV sources, advances in performance (F Bijkerk);
X-ray microprobes based on Bragg-Fresnel crystal optics for high energy
X-rays (V V Aristov et al); X-ray holography at the National Synchrotron
Ligh Source (C Jacobsen et al); Review on the development of cone-beam
X-ray microtomography (P C Cheng et al); The opportunities and challenges
of using high brilliance X-ray synchotron sources (P Pattison); Present
status of and future prospects for synchotron-based microtechniques that
utilize X-ray fluorescence, absorption spectroscopy, diffraction and
tomography (J V Smith); Properties and applications of soft x-ray
undulators in structural and microstructural studies of the surfaces of
materials (D P Woodruff); Review of EPMA and future developments (K F J
Heinrich).