261,95 €
261,95 €
inkl. MwSt.
Sofort per Download lieferbar
payback
131 °P sammeln
261,95 €
261,95 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
131 °P sammeln
Als Download kaufen
261,95 €
inkl. MwSt.
Sofort per Download lieferbar
payback
131 °P sammeln
Jetzt verschenken
261,95 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
131 °P sammeln
  • Format: ePub

Illustrating techniques in model development, signal processing, data reconciliation, process monitoring, quality assurance, intelligent real-time process supervision, and fault detection and diagnosis, Batch Fermentation offers valuable simulation and control strategies for batch fermentation applications in the food, pharmaceutical, and chemical industries. The book provides approaches for determining optimal reference trajectories and operating conditions; estimating final product quality; modifying, adjusting, and enhancing batch process operations; and designing integrated real-time…mehr

Produktbeschreibung
Illustrating techniques in model development, signal processing, data reconciliation, process monitoring, quality assurance, intelligent real-time process supervision, and fault detection and diagnosis, Batch Fermentation offers valuable simulation and control strategies for batch fermentation applications in the food, pharmaceutical, and chemical industries. The book provides approaches for determining optimal reference trajectories and operating conditions; estimating final product quality; modifying, adjusting, and enhancing batch process operations; and designing integrated real-time intelligent knowledge-based systems for process monitoring and fault diagnosis.

Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Autorenporträt
Ali Cinar (Illinois Institute of Technology, Chicago, USA) (Author) , Satish J. Parulekar (Illinois Inst. of Technology) (Author) , Cenk Undey (Illinois Institute of Technology, Chicago, Illinois, USA) (Author) , Gulnur Birol (Northwestern University, Evanston, Illinois USA) (Author)