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eBook, PDF
19. Oktober 2013
Springer Netherland
Broschiertes Buch | 74,99 € | |
Gebundenes Buch | 74,99 € |
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Broschiertes Buch
Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs
22. Juni 2010
LAP Lambert Academic Publishing
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Broschiertes Buch
Softcover reprint of the original 1st ed. 2014
23. August 2016
Springer / Springer Netherlands
978-94-024-0205-6
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Gebundenes Buch
2014
29. Oktober 2013
Springer / Springer Netherlands
978-94-007-7662-3
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