Daniel J. D. Sullivan, Eric J. Carleton

Failure Analysis

High Technology Devices

• Broschiertes Buch

Produktbeschreibung

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

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Produktdetails

• De Gruyter STEM
• Verlag: De Gruyter
• Seitenzahl: 128
• Erscheinungstermin: 24. Oktober 2022
• Englisch
• Abmessung: 244mm x 170mm x 7mm
• Gewicht: 238g
• ISBN-13: 9781501524783
• ISBN-10: 150152478X
• Artikelnr.: 64189675

Autorenporträt

Dr. Daniel J. D. Sullivan attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, ¿Don¿t Date Crazy¿ by DJDS, and published a board game called Infection. Dr. Eric J. Carleton is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.