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Gebundenes Buch
1989.
30. Juni 1989
Springer / Springer US / Springer, Berlin
978-0-7923-9025-1
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Broschiertes Buch
Softcover reprint of the original 1st ed. 1998
30. September 2012
Springer / Springer US / Springer, Berlin
978-1-4613-7606-4
Gebundenes Buch | 145,99 € | |
eBook, PDF | 137,95 € |
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Broschiertes Buch
2010
1. März 2012
Springer / Springer Netherlands
978-94-007-3094-6
Gebundenes Buch | 104,99 € | |
eBook, PDF | 105,95 € |
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Broschiertes Buch
Softcover reprint of the original 1st ed. 1998
12. Oktober 2012
Springer / Springer US / Springer, Berlin
978-1-4613-7561-6
Gebundenes Buch | 121,99 € | |
eBook, PDF | 113,95 € |
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Gebundenes Buch
2010 edition
7. Dezember 2009
Springer / Springer Netherlands
12645039,978-90-481-3442-7
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Gebundenes Buch
1998.
30. Juni 1998
Springer / Springer US / Springer, Berlin
978-0-7923-8184-6

Gebundenes Buch
1998.
31. Oktober 1998
Springer / Springer US / Springer, Berlin
978-0-7923-8295-9
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eBook, PDF
24. Dezember 2009
Springer Netherlands
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