An Introduction to Surface Analysis by XPS and AES - Watts, John F.; Wolstenholme, John
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Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
- Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
- Provides descriptions of latest instruments and techniques.
- Includes a detailed glossary of key surface analysis terms.
Inhaltsverzeichnis:
Preface.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative…mehr

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Produktbeschreibung
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
- Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
- Provides descriptions of latest instruments and techniques.
- Includes a detailed glossary of key surface analysis terms.

Inhaltsverzeichnis:
Preface.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative Interpretation.
Compositional Depth Profiling.
Applications of Electron Spectroscopy in Materials Science.
Comparison of XPS and AES with Other Analytical Techniques.
Glossary.
Bibliography.
Autorenporträt
J. F. Watts, The Surface Analysis Laboratory, School of Engineering, Univ. of Surrey, UK; J. Wolstenholme, Thermo VG Scientific, East Grinstead, UK