Ch Sateesh Kumar, M. Muralidhar Singh, Ram Krishna

Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

• Broschiertes Buch

Produktbeschreibung

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

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Produktdetails

• Verlag: Taylor & Francis Ltd
• Seitenzahl: 130
• Erscheinungstermin: 29. November 2024
• Englisch
• Abmessung: 234mm x 156mm
• Gewicht: 270g
• ISBN-13: 9781032375113
• ISBN-10: 1032375116
• Artikelnr.: 71912577

Autorenporträt

Ch Sateesh Kumar

Inhaltsangabe

1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3.
Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning
electron microscope (SEM) 6. Field emission scanning electron microscope
(FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force
Microscope (AFM) 9. Near-field scanning optical microscope Raman 10.
Optical characterization instruments 11. Synchrotron techniques 12. Other
advanced instruments used for characterization of functionally graded
materials