Jean-Paul Morniroli, Morniroli Morniroli

Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects

Übersetzer: Bres, Etienne

• Broschiertes Buch

Produktbeschreibung

This book is devoted to convergent-beam diffraction-a method capable of providing remarkably accurate crystallographic information. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.

Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 450
• Erscheinungstermin: 1. November 2004
• Englisch
• Abmessung: 237mm x 154mm x 33mm
• Gewicht: 621g
• ISBN-13: 9782901483052
• ISBN-10: 2901483054
• Artikelnr.: 25085441

Autorenporträt

The author Jean- Paul Morniroli is a professor in the Ecole Nationale Superieure de Chimie of Lille: his research is performed in the Laboratoire de Metallurgie et Genie des Materiaux CNRS 8517 of the Universite des Sciences at Technologies de Lille. He is a specialist in electron diffraction. The translator Etienne Bres is a Professor in the Universite des Sciences at Technologies de Lille, He is a specialist in the nanoscale characterization of biological and synthetic nanomaterials.

Inhaltsangabe

Introduction I
Bragg's law II
Formation of the diffraction pattern in the electron microscope III
Electron diffraction patterns produced by a parallel incident beam IV
Diffraction pattern produced by a convergent incident beam: CBED pattern V
Diffraction pattern produced by a large
angle convergent incident beam: Kossel pattern VI
Diffraction pattern produced by a large
angle convergent beam: LACBED Patterns VII
Diffracted and transmitted intensities XI
Characterization of crystal defects from LACBED patterns VIII
Experimental methods IX
LACBED variants X
Indexing LACBED patterns Conclusion