Broschiertes Buch
Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage
3. November 2015
Edizioni Accademiche Italiane
Broschiertes Buch
2014
5. Dezember 2013
Springer / Springer Milan / Springer, Berlin
86192452,978-88-470-5219-2
| eBook, PDF | 40,95 € |
eBook, PDF
19. November 2013
Springer Milan
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