Sleiman Bou-Sleiman, Mohammed Ismail

Built-in-Self-Test and Digital Self-Calibration for RF SoCs

• Broschiertes Buch

Produktbeschreibung

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

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Produktdetails

• SpringerBriefs in Electrical and Computer Engineering
• Verlag: Springer / Springer New York / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4419-9547-6
• 2012
• Seitenzahl: 108
• Erscheinungstermin: 22. September 2011
• Englisch
• Abmessung: 235mm x 155mm x 7mm
• Gewicht: 178g
• ISBN-13: 9781441995476
• ISBN-10: 1441995471
• Artikelnr.: 32767725

Inhaltsangabe

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.