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This book provides readers a theoretical framework to understand different types of surface plasmon (SP) microscope setups through the rigorous diffraction theory. The framework analyses the diffraction process through rigorous wave coupled analysis (RCWA) and a software package processes the diffracted orders to recover the microscope response for a range of different systems. In this book I will investigate the non-interferometric SP microscope, interferometric SP microscope and confocal SP microscope. I will show that the non-interferometric system exhibits a trade-off between lateral…mehr

Produktbeschreibung
This book provides readers a theoretical framework to understand different types of surface plasmon (SP) microscope setups through the rigorous diffraction theory. The framework analyses the diffraction process through rigorous wave coupled analysis (RCWA) and a software package processes the diffracted orders to recover the microscope response for a range of different systems. In this book I will investigate the non-interferometric SP microscope, interferometric SP microscope and confocal SP microscope. I will show that the non-interferometric system exhibits a trade-off between lateral resolution and sensitivity, where an image obtained with a good contrast will have low lateral resolution. In order to get around the trade-off, the interferometric system can be employed; however, the main challenge for the interferometric setup is its optical alignment. I will show that a confocal SP microscope, which has been developed as a part of my doctoral degree, can simplify the complexity of the interferometric system and give similar measurement performance.
Autorenporträt
Dr Suejit Pechprasarn (PhD) received a First Class honours degree and a PhD in Electrical and Electronic Engineering in 2007 and 2012 respectively from the University of Nottingham, UK. Since 2012, he has been appointed as a Post-Doctoral Fellow at the Institute of Biophysics, Imaging and Optical Science (IBIOS) at the University of Nottingham.