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  • Gebundenes Buch

This groundbreaking reviews the latest research on the use of control charts to monitor process and product quality profiles. . It is written by experts in the field of statistical process control (such as J. D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). The book presents a comprehensive coverage of profiles monitoring definitions, techniques, models, and application examples, especially in various fields of engineering and statistics. It covers state-of-the-art materials and…mehr

Produktbeschreibung
This groundbreaking reviews the latest research on the use of control charts to monitor process and product quality profiles. . It is written by experts in the field of statistical process control (such as J. D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). The book presents a comprehensive coverage of profiles monitoring definitions, techniques, models, and application examples, especially in various fields of engineering and statistics. It covers state-of-the-art materials and deserves a place among the tools of every quality engineer who works in monitoring and improving statistical processes.
A one-of-a-kind presentation of the major achievements in statistical profile monitoring methods

Statistical profile monitoring is an area of statistical quality control that is growing in significance for researchers and practitioners, specifically because of its range of applicability across various service and manufacturing settings. Comprised of contributions from renowned academicians and practitioners in the field, Statistical Analysis of Profile Monitoring presents the latest state-of-the-art research on the use of control charts to monitor process and product quality profiles. The book presents comprehensive coverage of profile monitoring definitions, techniques, models, and application examples, particularly in various areas of engineering and statistics.

The book begins with an introduction to the concept of profile monitoring and its applications in practice. Subsequent chapters explore the fundamental concepts, methods, and issues related to statistical profile monitoring, with topics of coverage including:
Simple and multiple linear profiles
Binary response profiles
Parametric and nonparametric nonlinear profiles
Multivariate linear profiles monitoring
Statistical process control for geometric specifications
Correlation and autocorrelation in profiles
Nonparametric profile monitoring

Throughout the book, more than two dozen real-world case studies highlight the discussed topics along with innovative examples and applications of profile monitoring. Statistical Analysis of Profile Monitoring is an excellent book for courses on statistical quality control at the graduate level. It also serves as a valuable reference for quality engineers, researchers and anyone who works in monitoring and improving statistical processes.
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Autorenporträt
RASSOUL NOOROSSANA, PhD, is Professor of Industrial Engineering at Iran University of Science and Technology. A Certified Six Sigma Black Belt, he has published extensively in the areas of statistical quality control, engineering statistics, total quality management, and Six Sigma. ABBAS SAGHAEI, PhD, is Associate Professor of Industrial Engineering at Islamic Azad University, Iran. He currently focuses his research in the areas of statistical process control, design of experiments, and Six Sigma. AMIRHOSSEIN AMIRI, PhD, is Assistant Professor of Industrial Engineering at Shahed University, Iran. He has authored numerous papers in the areas of statistical process control and improvement, quality management and productivity, and design of experiments.