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This book examines the interference involved with instruments that employ electronic techniques to measure physical quantities, including random fluctuations from thermal or background sources and systematic signal drift or offset. It fully analyzes 1/f as well as white noise and also discusses the theory and practice of baseline correction, low-pass filtering, multiple time averaging, and phase-sensitive detection. The author explores the best way of measuring the amplitude or the time of occurrence of a signal of known shape. New to this edition are an additional chapter, frequency measurement, and tutorial questions with answers to test understanding of the subject matter.