Material Characterization using Electron Holography - Shindo, Daisuke;Tomita, Takeshi
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This book addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell?s equations formulated by the special relativity which would lead to developing and understanding electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to image materials in higher resolution which would help in improved image reconstruction. The focus of this book is on in-situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques such as direct…mehr

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Produktbeschreibung
This book addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell?s equations formulated by the special relativity which would lead to developing and understanding electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to image materials in higher resolution which would help in improved image reconstruction. The focus of this book is on in-situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques such as direct observation of accumulation and collective motions of electrons around the charged insulators are also explained. Therefore , ensures, a deeper understanding of functionalities of advanced materials.
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Autorenporträt
Daisuke Shindo is Team Leader, RIKEN Center for Emergent Matter Science and Professor Emeritus, Tohoku University. He is Fellow of the Japan Institute of Metals and Materials, and also Fellow of Korean Society of Microscopy. He has been involved in high-resolution electron microscopy and analytical electron microscopy for microstructure characterization of various materials for more than 30 years. He is currently interested in electromagnetic-field observation of advanced materials by electron holography of collective motions of electrons through electromagnetic field variations.   Takeshi Tomita developed various instruments of electron microscopes, especially electron guns and lens systems in JEOL Ltd. for more than 40 years. He was involved in the project of the development of Cs-corrected TEMs. He is also attributed to the development of a secondary electron energy analyzer for TEMs. He has deep knowledge about the electromagnetic field and the special relativity.