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  • Broschiertes Buch

The book contains Performance characteristics of Instruments: Static characteristics, Accuracy, Precision, Resolution, Sensitivity, static and dynamic calibration, Errors in Measurement, and their statistical analysis, dynamic characteristics-speed of Response, fidelity, Lag and dynamic error. DC ammeters, DC voltmeters-multirange, range extension/solid state and differential voltmeters, AC voltmeters-multirange, range extension. Thermocouple type RF ammeter, ohm meters, series type, shunt type, multimeter for voltage, current and resistance measurements. Oscilloscopes: Standard specifications…mehr

Produktbeschreibung
The book contains Performance characteristics of Instruments: Static characteristics, Accuracy, Precision, Resolution, Sensitivity, static and dynamic calibration, Errors in Measurement, and their statistical analysis, dynamic characteristics-speed of Response, fidelity, Lag and dynamic error. DC ammeters, DC voltmeters-multirange, range extension/solid state and differential voltmeters, AC voltmeters-multirange, range extension. Thermocouple type RF ammeter, ohm meters, series type, shunt type, multimeter for voltage, current and resistance measurements. Oscilloscopes: Standard specifications of CRO,CRT features, derivation of deflection sensitivity, vertical and horizontal amplifiers, horizontal and vertical deflection systems, sweep trigger pulse, delay line, sync selector circuits, probes for CRO - active, passive, and attenuator type, triggered sweep CRO, and Delayed sweep, dual trace/beam CRO, Measurement of amplitude, frequency and phase (Lissajous method). Principles of sampling oscilloscope, storage oscilloscope, and digital storage oscilloscope, Digital frequency counters, time & Period measurements.
Autorenporträt
Prof. Vishwajit Barbuddhe is currently working as Assistant Professor in Jagadambha College of Engineering & Tech., Yavatmal, having 11 Years of Teaching experience. He has published 45 research paper in International Journals & presented 6 research paper in International Conference. His area of interest is Digital Image Processing & networking.