D. B. Holt, B. G. Yacobi

Extended Defects in Semiconductors

Electronic Properties, Device Effects and Structures

• Broschiertes Buch

Produktbeschreibung

An advanced undergraduate/graduate-level text explaining the properties and roles of extended defects in semiconductors.

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Produktdetails

• Verlag: Cambridge University Press
• Seitenzahl: 644
• Erscheinungstermin: 25. März 2014
• Englisch
• Abmessung: 244mm x 170mm x 34mm
• Gewicht: 1094g
• ISBN-13: 9781107424142
• ISBN-10: 1107424143
• Artikelnr.: 41247555

Autorenporträt

David Holt is an Emeritus Professor in the Department of Materials at Imperial College, London. He obtained his doctorate in Physical Metallurgy from the University of Birmingham, UK, in 1956, after which he held a number of academic positions over five years in the physics department at the University of the Witwatersrand, South Africa, before moving to the Department of Metallurgy at Imperial College, London. He has remained at Imperial College since then, except for a sabbatical year in the School of Physics at the University of New South Wales, Australia, and shorter periods at the Indian Institute of Technology, Kanpur, India. He has been a regular visitor at the Maspec Institute (now part of IMEM) in Parma, Italy. He researched the science and technology of semiconducting materials and devices and developed and applied techniques for their characterization in the scanning electron microscope. He is author or co-author of approximately 150 scientific publications and has co-authored or edited five previous books.

Inhaltsangabe

1. Semiconducting materials
2. An introduction to extended defects
3. Characterization of extended defects in semiconductors
4. Core structures and mechanical effects of extended defects specific to semiconductors
5. The electrical, optical and device effects of dislocations and grain boundaries
6. Point defect materials problems.