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Impact of Electron and Scanning Probe Microscopy on Materials Research

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Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

31.10.1999

Herausgeber

David G. Rickerby + weitere

Verlag

Springer Netherland

Seitenzahl

489

Maße (L/B/H)

24,1/16/3,3 cm

Gewicht

898 g

Auflage

1999

Sprache

Englisch

ISBN

978-0-7923-5939-5

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

31.10.1999

Herausgeber

Verlag

Springer Netherland

Seitenzahl

489

Maße (L/B/H)

24,1/16/3,3 cm

Gewicht

898 g

Auflage

1999

Sprache

Englisch

ISBN

978-0-7923-5939-5

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: ProductSafety@springernature.com

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  • Produktbild: Impact of Electron and Scanning Probe Microscopy on Materials Research
  • Produktbild: Impact of Electron and Scanning Probe Microscopy on Materials Research
  • Table of contents. Preface. Participants photos. List of Contributors. List of Participants. The impact of electron microscopy on materials research; G. Thomas. Microstructural design and tayloring of advanced materials; G. Thomas. Nanostructured materials; V. Provenzano. Characterization of heterophase transformation interfaces by highresolution transmission electron microscope techniques; J.M. Howe. High resolution scanning electron microscopy observations of nanoceramics; J.Th.M. de Hosson, et al. Metal-ceramic interfaces studied with high resolution transmission electron microscopy; J.Th.M. de Hosson, et al. Z-contrast scanning transmission electron microscopy; S.J. Pennycook, P.D. Nellist. Electron energy loss spectrometry in the electron microscope - Part 1: Introduction; L.M. Brown. Electron energy loss spectrometry in the electron microscope - Part 2: EELS in the context of solid state spectroscopies; L.M. Brown. Electron energy loss spectrometry in the electron microscope - Part 3: Interfaces and localised spectrometry; L.M. Brown. EELS near edge structures. Application to intermetallic alloys and other materials; G.A. Botton. Surface chemistry and microstructure analysis of novel technological materials; M.L. Trudeau. Convergent beam electron diffraction; C.J. Humphreys. New developments in scanning probe microscopy; E. Meyer, et al. Low-energy scanning electron microscope for nanolithography; A. Zlatkin, N. García. Application of low voltage Scanning Electron Microscopy and energy dispersive x-ray spectroscopy; D.G. Rickerby. Environmental SEM and related applications. History of the environmental SEM and basic design concepts; T.A. Hardt. Environmental SEM and related applications; T.A. Hardt. Environmental SEM andrelated applications. Gas interactions and gaseous amplification; T.A. Hardt. ESEM image contrast and applications to wet organic materials; A.M. Donald, B.L. Thiel. Advanced electron and scanning probe microscopy on dental and medical materials research; G. Valdrè. Correlative microscopy and probing in materials science; G. Valdrè. Epilogue. Subject index.