Y. Waseda

Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials

• Broschiertes Buch

Produktdetails

• Lecture Notes in Physics 204
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-540-13359-9
• 1984.
• Seitenzahl: 196
• Erscheinungstermin: 1. Juli 1984
• Englisch
• Abmessung: 235mm x 155mm x 11mm
• Gewicht: 320g
• ISBN-13: 9783540133599
• ISBN-10: 3540133593
• Artikelnr.: 39980584

Inhaltsangabe

A brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects.