Rahul Singh Rajput

Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat

• Broschiertes Buch

Produktbeschreibung

The main objective of this book was to determine the correlation and path analysis of yield and yield contributing characters in bread wheat and to assess their suitability in a breeding plan. In agriculture, Path analysis has been used by plant breeders to assist in identifying traits that are useful as selection criteria to improve crop yield. Total correlation between yield and component traits may be sometimes misleading as it might be an over-estimate and under-estimate because of its association with other character. In this research, total correlation are splitted into direct and indirect effects of cause would give more meaningful interpretation to the cause of association between the dependent variable like yield and independent variable like yield component. This kind of information will be helpful in formulating the selection criteria, indicating the selection for desirable characters is likely to bring about on overall improvement in single plant yield directly.

Produktdetails

• Verlag: LAP Lambert Academic Publishing
• Seitenzahl: 60
• Erscheinungstermin: 23. Mai 2019
• Englisch
• Abmessung: 220mm x 150mm x 4mm
• Gewicht: 108g
• ISBN-13: 9786200092076
• ISBN-10: 6200092079
• Artikelnr.: 56966993

Autorenporträt

Rahul Singh Rajput arbeitet derzeit als Assistenzprofessor am Department of Agriculture, Mandsaur University, Mandsaur, M.P. Er erhielt seinen B.Sc. (Ag) und M.Sc. (Ag) Abschluss in Genetik und Pflanzenzüchtung von RVSKVV, Gwalior, M.P. und er qualifizierte sich auch NET (ASRB, ICAR). Er hat auch als Senior Research Fellow bei IARI, RS Indore, gearbeitet.