Many of the product recalls that we see daily are due to unexpected failures resulting from poor reliability analysis during the product design stage. Minitab is a statistical software package that has a highly useful set of "Reliability/Survival" tools, but those tools are barely explored or explained in literature. This new book illustrates th
Many of the product recalls that we see daily are due to unexpected failures resulting from poor reliability analysis during the product design stage. Minitab is a statistical software package that has a highly useful set of "Reliability/Survival" tools, but those tools are barely explored or explained in literature. This new book illustrates th
Kishore K. Pochampally is a professor at Southern New Hampshire University. He teaches lean six sigma, business analytics, project management, and operations management. He holds a Ph.D. in industrial engineering from Northeastern University. He is a Six Sigma Black Belt (ASQ), Project Management Professional (PMP®), and Certified Analytics Professional (CAP®). Surendra M. Gupta is a professor of mechanical and industrial engineering and the director of the laboratory for responsible manufacturing at Northeastern University. He received his BE from Birla Institute of Technology and Science, MBA from Bryant University, and MSIE and Ph.D. from Purdue University. Dr. Gupta's research interests span the areas of production/manufacturing systems and operations research. He has authored/coauthored well over 500 technical papers published in books, journals and international conference proceedings which have been cited worldwide by thousands of researchers. He is the recipient of outstanding research, industrial engineering professor, and doctoral dissertation advisor awards.
Inhaltsangabe
INTRODUCTION. Fundamental Concepts in Reliability Analysis. Commonly Used Statistical Distributions in Reliability Analysis. CASE STUDIES. Reliability Analysis with Right-Censored and Exact Failure Times. Reliability Analysis with Arbitrarily Censored Failure Times. Nonparametric Reliability Analysis. Warranty Analysis. Accelerated Life Testing. Reliability Test Plan with Constrained Test Time and Number of Failures. Reliability Test Plan with Constrained Sample Size and Number of Failures. Comparison of Reliability of Parts from Different Vendors. Determination of Factors That Affect Product Reliability. Prediction of Stress Levels That Cause Product Failure. Bibliography.
INTRODUCTION. Fundamental Concepts in Reliability Analysis. Commonly Used Statistical Distributions in Reliability Analysis. CASE STUDIES. Reliability Analysis with Right-Censored and Exact Failure Times. Reliability Analysis with Arbitrarily Censored Failure Times. Nonparametric Reliability Analysis. Warranty Analysis. Accelerated Life Testing. Reliability Test Plan with Constrained Test Time and Number of Failures. Reliability Test Plan with Constrained Sample Size and Number of Failures. Comparison of Reliability of Parts from Different Vendors. Determination of Factors That Affect Product Reliability. Prediction of Stress Levels That Cause Product Failure. Bibliography.
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