Structure Determination of Transition Metal Chalcogenides - Dasadia, Abhay;Solanki, Vanaraj;Nariya, Brinda
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The X-ray diffraction is a useful tool for research work and different types of analysis like powder analysis, texture analysis, stress analysis, single crystal analysis, high-resolution analysis. All of these studies are under nondestructive testing.This book emphasizes on structure determination techniques of transition metal chalcogenides using x-rays diffraction. Work presented in book mainly describes the use of Powder X-ray Diffraction (PXRD) and single crystal diffraction calculations for the determination of crystal structure for transition metal chalcogenides.

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Produktbeschreibung
The X-ray diffraction is a useful tool for research work and different types of analysis like powder analysis, texture analysis, stress analysis, single crystal analysis, high-resolution analysis. All of these studies are under nondestructive testing.This book emphasizes on structure determination techniques of transition metal chalcogenides using x-rays diffraction. Work presented in book mainly describes the use of Powder X-ray Diffraction (PXRD) and single crystal diffraction calculations for the determination of crystal structure for transition metal chalcogenides.
Autorenporträt
Abhay Dasadia a obtenu un M.Sc. (Solid State Physics) en 2008, un M.Phil en 2009 et un Ph.D (Crystal Growth) en 2013 du département de physique de l'université S.P., Vallabh Vidyanagar, Gujarat, Inde. Actuellement, il est professeur adjoint de physique à l'Institut de technologie A.D.Patel, New Vallabh Vidyanagar, Gujarat, Inde.